S | Sulfur |
SA | Surface area; Subresolution assist; Structured analysis |
SAA | Static automated analysis |
SAB | Sensor/actuator bus |
SACD | Super Audio CD |
SAD | Selected Area Diffraction |
SAE | Society of Automotive Engineers |
SAED | Selected Area Electron Diffraction |
SAG | Self Aligned Gate |
SAM | Scanning Auger Microscopy |
SAN | Storage Area Network |
SANS | Small Angle Neutron Scattering |
SAR | Successive Approximation Register; Synthetic Aperture Radar |
SARE | Segmentation And Reassembly Element |
SAS | Suspended Air Stripline |
SASER | Sound Amplification by Stimulated Emission of Radiation |
SAT | Spray acid tool |
SAVE | SAARC Audio Visual Exchange |
SAW | Surface-Acoustic Wave |
SAX | Simple API for XML |
SAXS | Small Angle X-ray Scattering |
SB | Strong base ion exchange |
SBC | S Bus Circuit |
SBC-X | S Bus Circuit Extended |
SBD | Schottky Barrier Diode |
SBL | Scanned Beam Laminography |
SBT | Slender Body Theory |
SBU | Sequential build-up |
SC | Semi-Conducting; Short Circuit |
SCA | Surface charge analysis |
SCALPEL | Scattering with Angular Limitation in Projection Electron-beam Lithography |
SCART | European connector definition for TVs and VCRs |
SCBA | Self-contained breathing apparatus |
SCC | Strategic cell controller |
SCCOS | Secure Chip Card Operating System |
SCCS | Source code control system |
SCE | Saturated calomel electrode |
SCF | Super critical fluid |
SCI | Surface charge imaging |
SCIC | Semiconductor integrated circuit |
SCK | Smart Commercial Kitchen |
SCM | Scanning capacitance microscopy |
SCNT | Single Chip Network Termination |
SCOSTA | Smart Card Operating System for Transport Application |
SCP | Single chip package |
SCR | Silicon controlled rectifier |
SCS | Single Crystal Silicon |
SCSI | Small Computer Systems Interface |
SCT | SciTex continuous tone image format |
SCTE | Society of Telecommunications Engineers |
SCU | Satellite Communication Unit |
SC1 | Standard Clean 1 |
SC2 | Standard Clean 2 |
SD | Small dual in-line package; structured design; single density |
SDARS | Satellite Digital Audio Radio System |
SDFL | Schottky-diode FET logic |
SDH | Synchronous Digital Hierarchy |
SDHT | Selectively Doped Heterojunction Transistor; SDH/SONET Transceiver |
SDI | Serial Data Interface |
SDI | Serial Digital Interface |
SDLC | Synchronous data link control |
SDLTS | Scanning Deep-Level Transient Spectroscopy |
SDM | Specific Device Model for SAB |
SDMI | Secure Digital Music Initiative |
SDR | Software Defined Radio |
SDRAM | Synchronous Dynamic Random Access Memory |
SDS | Smart distributed system |
SDSI | Synchronous data-link control |
SE | Spectroscopic ellipsometry; secondary electron; Seed End; Surface Element |
SE | Spreading Efficiency |
SEAJ | Semiconductor Equipment Association of Japan |
SEC | Size exclusion chromatography; Solvent extract conductivity |
SECAM | Sequence Electronique Couleur Avec Memoire (Electronic Colour Sequence with Memory) |
SECS | Semiconductor Equipment Communications Standard |
SEDOR | Spin Echo DOuble Resonance |
SEG | Selective epitaxial growth |
SEIM | Software engineering improvement method |
SEL | Surface Emitting Laser |
SEM | Scanning Electron Microscopy; Specific Equipment Model; Standard Electronic Module |
SEMI | Semiconductor Equipment and Materials International |
SEMISPIN | Semiconductor Software Process Improvement Network |
SEP | Software engineering process |
SEPG | Software Engineering Process Group |
SEQDB | Semiconductor Equipment Database |
SERA | Sequential Electrochemical Reduction Analysis |
SERDES | Serialization/Deserialization |
SES | Secondary Electron Spectroscopy |
SET | Single Electron Tunneling/TransPort |
SETEC | Semiconductor Equipment Technology Center |
SEXAFS | Surface Extended X-ray Absorption Fine Structure |
SF | Super Fluorescence |
SFB | Symmetry Breaking Force |
SFC | Supercritical fluid chromatography |
SFD | Stacking Fault Density |
SFDR | Spurious Free Dynamic Range |
SFG | Sum Frequency Generation |
SFM | Surface feet per minute |
SFTPS | Secure File Transfer Protocol |
SGML | Standard Generalized Markup Language |
SGMM | Semiconductor Generic Manufacturing Model |
SGMRS | Semiconductor Generic Manufacturing Requirements Specification |
SGRAM | Synchronous Graphics Random Access Memory |
SGV | Scalable Vector Graphics |
SHA | Secure Hash Algorithm |
SHAC | Simple Hands-free Add-on Circuit |
SHARC | Super Harvard Architecture Computer |
SHF | Super high frequency |
SHF | Super HyperFine (interaction) |
SHG | Second Harmonic Generation |
SI | Semi-Insulating; Service Information |
SIA | Semiconductor Industry Association |
SICAT | Siemens Concept Analog Telephone |
SICOFI | Signalling Codec Filter |
SIDP | Sputter ion depth profiling |
SIL | Systems Integration Lab |
SIM | Subscriber Identity Module |
SIMO | Single Input Multiple Output |
SIMOX | Separation by implantation of oxygen |
SIMS | Secondary Ion Mass Spectroscopy |
SIO | Serial Input Output |
SIOA | Surface Induced Optical Anisotropy |
SIP | Silicon Intellectual Property |
SIP | Single in-line package |
SIP | Session Initiation Protocol |
SIP | Single in-line package |
SIPO | Serial In Parallel output |
SIR | Surface Insulation Resistance |
SIRIJ | Semiconductor Industry Research Institute of Japan |
SISFET | Semiconductor-Insulator-Semiconductor FET |
SISO | Serial in serial out |
SISO | Single Input Single Output |
SIT | Static Induction Transistor, System Interface Test |
SIV | Sensors in vacuum |
SL | Specification limit; Super lattice |
SLAC | Subscriber Line Audio processing interface |
SLAM | Scanning laser acoustic microscopy |
SLC | Surface Laminar Circuit; Single Layer Cap |
SLEED | Spin-Polarized Low Energy Electron Diffraction |
SLIC | Standard-function Linear Integrated Circuit; Subscriber Line Interface Circuit |
SLICOFI | Subscriber Line Interface Circuit and Signaling Codec Filter |
SLM | Spatial Light Modulator |
SLOC | Source lines of code |
SLPSS | Semiconductor Laser Pumped Solid State |
SLSI | Super large scale integration |
SLV | Satellite Launch Vehicle |
SM | Stress migration; Surface mount |
SMA | Shape Memory Alloy; Surface Mount Assembly; Sub-Miniature type A |
SMB | Single-mask bumping |
SMC | Surface-mounted components |
SMD | Surface Mount Devices |
SME | Subject matter expert; Software maintenance engineer |
SMEMA | Surface Mount Equipment Manufacturers Association |
SMG | Screen management guide |
SMID | Single Instruction Multiple Data |
SMIF | Standard mechanical interface |
SMIL | Synchronized Multi-media Integration Language |
SMOBC | Solder mask over bare copper |
SMPM | SECS message protocol machine |
SMPTE | Society of Motion Picture and Television Engineers |
SMR | Semiconductor mask representation |
SMS | SECS message service; Short Messaging Service |
SMSC | Short Message Switching Center |
SMT | Surface Mount Technology |
SMTA | Surface Mount Technology Association |
SMTP | Simple Mail Transfer Protocol |
SMTS | Strategic Material Transport System |
SNA | System Network Architechture |
SNA | Scalar Network Analyzer |
SNMP | Simple Network Management Protocol |
SNMS | Sputtered neutral mass spectroscopy |
SNOM | Scanning nearfield optical microscopy |
SNR | Signal-to-noise ratio |
SO | Small outline (package) |
SOAP | Simple Object Access Protocol |
SOC | System on (a) Chip |
SoC | System on Chip |
SOD | Spin-On-Dielectric; Silicon On Diamond; Small Outline Diode; Source Over Drain |
SODIMM | Small Outline Dual-In-line Memory Module |
SOG | Spin-On Glass; Source Over Gate |
SOHO | Small Office Home Office |
SOI | Silicon On Insulator; Second Order Intercept |
SOIC | Small Outline IC |
SOLT | Short Open Load Through |
SOM | Scanning Optical Microscopy |
SONET | Synchronous Optical NETwork |
SOP | Standard operating procedure; Small outline package |
SoPC | System on Programmable Chip |
SOS | Silicon on sapphire |
SOT | Small Outline Transistor |
SOW | Statement Of Work |
SP | Simple Profile |
SP3T | Single Pole Triple Throw |
SPA-LEED | Spot Profile Analysis Low Energy Electron Diffraction |
SPC | Statistical process control; Surface Photoconductivity |
SPDE | Service Provider Delivery Environment |
SPDT | Single pole double throw |
SPEG | Solid Phase Epitaxy Growth |
SPGA | Staggered Pin Grid Array; System Programmable Gate Array |
SPI | Software Process Improvement; Serial-peripheral interface protocol |
SPICE | Simulation program with integrated circuit emphasis |
SPIDER-MEM | SPIDER-Manufacturing Equipment Monitor |
SPIN | Software Process Improvement Network |
SPLD | Simple Programmable Logic Device |
SPLICS | Special-Purpose Linear Integrated Circuits |
SPM | Scanning probe microscopy |
SPP | Single-phase printing |
SPR | Semiconductor process representation |
SPST | Single Pole, Single Throw |
SPT | Shortest processing time |
SPTM | Self Printing Ticketing Machine |
SPTS | Simple Program Transport Stream |
SPV | Surface Photovoltage Spectroscopy |
SPX | Sequential Packet Exchange |
SQC | Statistical quality control |
SQL | Structured Query Language |
SQM | System Quality Manager |
SQPMM | Software Quality and Process Maturity Model |
SQUID | Super conducting QUantum Interference Device |
SR | Shift register |
SRAC | Supplier Relations Action Council |
SRAM | Static Random Access Memory |
SRC | Semiconductor Research Corporation |
SRP | Spreading resistance probe |
SRPT | Shortest remaining processing time |
SRS | Software requirements specification |
SS | Single Sided; Small Signal |
SSA | Semiconductor Industry Association |
SSB | Single sideband |
SSC | Standard Speech Circuit |
SSE | Sum squared error |
SSEM | Stepper Specific Equipment Model |
SSFDC | Solid-State Floppy-Disk Card |
SSG | Small Signal Gain |
SSH | Secure SHell |
SSI | Small scale integration |
SSL | Secure Socket Layer |
SSM | Strategic Sourcing Methodology |
SSMA | Sub-SMA |
SSOP | Shrink Small Outline Package |
SSPA | Solid State Power Amplifier |
SSQA | Standardized Supplier Quality Assessment |
SSR | Static Shift Register; Solid State Relay |
SSRAM | Synchronous (cache) Static Ramdom Access Memory |
SSW | Seismic Surface Wave |
STAF | SDH Transceiver And Framer |
STALO | STAble Local Oscillator |
STAR | Simultaneous transmitted and reflected |
STB | Set Top Box |
STD | Subscribers Trunk Dialling |
STE | Special Test Equipment |
STEL | Short-term exposure limit |
STEM | Scanning Transmission Electron Microscopy |
STEP | Standard for Exchange of Product Model Data |
STHM | Scanning Thermal Microscope |
STI | Shallow Trench Isolation |
STL | Schottky Transistor Logic |
STM | Scanning Tunneling Microscopy |
STP | Software Technology Park |
STP | Standard Temperature and Pressure; System Test Plan; Shielded Twisted Pair |
SU | Subresolution attenuated |
SUT | System under test |
SUV | Small Unit Verification |
SVD | Singular value decomposition |
SVG | Scalable Vector Graphic |
SW | Short wave |
SWAT | Software Action Team |
SWEAT | Standard wafer-level electromigration accelerated test |
SWI | Static walkthrough/inspection |
SWIM | Semiconductor Workbench for Integrated Modeling |
SWP | Single Wafer Processing |
SWR | Semiconductor Wafer Representation |
SWR | Standing Wave Ratio |
SWV | Square Wave Voltammetry |
SXPS | Soft X-ray Photoelectron Spectroscopy |
S/A | Sensor/actuator |
S/D | Source/drain |
S/N | Serial number |
S/N | Signal to Noise Ratio |
S/PDIF | Sony/Philips Digital Interface |
Si | Silicon |
SiGe | Silicon Germanium |
SLIP | Single Line Internet Protocol |
S-MIME | Secure MIME |
Sn | Tin |
SportsML | Sports Mark-up Language |
sq cm | Square centimeter |
SYNC | Synchronous |