| S |
Sulfur |
| S.A |
Surface area; Subresolution assist; Structured analysis |
| S.A.A |
Static automated analysis |
| S.A.B |
Sensor/actuator bus |
| S.A.C.D |
Super Audio CD |
| S.A.D |
Selected Area Diffraction |
| S.A.E |
Society of Automotive Engineers |
| S.A.E.D |
Selected Area Electron Diffraction |
| S.A.G |
Self Aligned Gate |
| S.A.M |
Scanning Auger Microscopy |
| S.A.N |
Storage Area Network |
| S.A.N.S |
Small Angle Neutron Scattering |
| S.A.R |
Successive Approximation Register; Synthetic Aperture Radar |
| S.A.R.E |
Segmentation And Reassembly Element |
| S.A.S |
Suspended Air Stripline |
| S.A.S.E.R |
Sound Amplification by Stimulated Emission of Radiation. |
| S.A.T |
Spray acid tool |
| S.A.V.E |
SAARC Audio Visual Exchange. |
| S.A.W |
Surface-Acoustic Wave. |
| S.A.X |
Simple API for XML |
| S.A.X.S |
Small Angle X-ray Scattering |
| S.B |
Strong base ion exchange |
| S.B.C |
S Bus Circuit |
| S.B.C-X |
S Bus Circuit Extended |
| S.B.D |
Schottky Barrier Diode |
| S.B.L |
Scanned Beam Laminography |
| S.B.T |
Slender Body Theory |
| S.B.U |
Sequential build-up |
| S.C |
Semi-Conducting; Short Circuit |
| S.C.A |
Surface charge analysis |
| S.C.A.L.P.E.L |
Scattering with Angular Limitation in Projection Electron-beam
Lithography |
| S.C.A.R.T |
European connector definition for TVs and VCRs |
| S.C.B.A |
Self-contained breathing apparatus |
| S.C.C |
Strategic cell controller |
| S.C.C.O.S |
Secure Chip Card Operating System. |
| S.C.C.S |
Source code control system |
| S.C.E |
Saturated calomel electrode |
| S.C.F |
Super critical fluid |
| S.C.I |
Surface charge imaging |
| S.C.I.C |
Semiconductor integrated circuit |
| S.C.K |
Smart Commercial Kitchen. |
| S.C.M |
Scanning capacitance microscopy |
| S.C.N.T |
Single Chip Network Termination |
| S.C.O.S.T.A |
Smart Card Operating System for Transport Application. |
| S.C.P |
Single chip package |
| S.C.R |
Silicon controlled rectifier |
| S.C.S |
Single Crystal Silicon |
| S.C.S.I |
Small Computer Systems Interface. |
| S.C.T |
SciTex continuous tone image format |
| S.C.T.E |
Society of Telecommunications Engineers |
| S.C.U |
Satellite Communication Unit. |
| S.C1 |
Standard Clean 1 |
| S.C2 |
Standard Clean 2 |
| S.D |
Small dual in-line package; structured design; single density |
| S.D.A.R.S |
Satellite Digital Audio Radio System. |
| S.D.F.L |
Schottky-diode FET logic |
| S.D.H |
Synchronous Digital Hierarchy |
| S.D.H.T |
Selectively Doped Heterojunction Transistor; SDH/SONET Transceiver |
| S.D.I |
Serial Data Interface. |
| S.D.I |
Serial Digital Interface. |
| S.D.L.C |
Synchronous data link control |
| S.D.L.T.S |
Scanning Deep-Level Transient Spectroscopy |
| S.D.M |
Specific Device Model for SAB |
| S.D.M.I |
Secure Digital Music Initiative |
| S.D.R |
Software Defined Radio |
| S.D.R.A.M |
Synchronous Dynamic Random Access Memory |
| S.D.S |
Smart distributed system |
| S.D.S.I |
Synchronous data-link control |
| S.E |
Spectroscopic ellipsometry; secondary electron; Seed End; Surface
Element |
| S.E |
Spreading Efficiency. |
| S.E.A.J |
Semiconductor Equipment Association of Japan |
| S.E.C |
Size exclusion chromatography; Solvent extract conductivity |
| S.E.C.A.M |
Sequence Electronique Couleur Avec Memoire (Electronic Colour Sequence
with Memory) |
| S.E.C.S |
Semiconductor Equipment Communications Standard |
| S.E.D.O.R |
Spin Echo DOuble Resonance |
| S.E.G |
Selective epitaxial growth |
| S.E.I.M |
Software engineering improvement method |
| S.E.L |
Surface Emitting Laser |
| S.E.M |
Scanning Electron Microscopy; Specific Equipment Model; Standard
Electronic Module |
| S.E.M.I |
Semiconductor Equipment and Materials International |
| S.E.M.I.S.P.I.N |
Semiconductor Software Process Improvement Network |
| S.E.P |
Software engineering process |
| S.E.P.G |
Software Engineering Process Group |
| S.E.Q.D.B |
Semiconductor Equipment Database |
| S.E.R.A |
Sequential Electrochemical Reduction Analysis |
| S.E.R.D.E.S |
Serialization/Deserialization |
| S.E.S |
Secondary Electron Spectroscopy |
| S.E.T |
Single Electron Tunneling/TransPort |
| S.E.T.E.C |
Semiconductor Equipment Technology Center |
| S.E.X.A.F.S |
Surface Extended X-ray Absorption Fine Structure |
| S.F |
Super Fluorescence |
| S.F.B |
Symmetry Breaking Force |
| S.F.C |
Supercritical fluid chromatography |
| S.F.D |
Stacking Fault Density |
| S.F.D.R |
Spurious Free Dynamic Range |
| S.F.G |
Sum Frequency Generation |
| S.F.M |
Surface feet per minute |
| S.F.T.P.S |
Secure File Transfer Protocol |
| S.G.M.L |
Standard Generalized Markup Language |
| S.G.M.M |
Semiconductor Generic Manufacturing Model |
| S.G.M.R.S |
Semiconductor Generic Manufacturing Requirements Specification |
| S.G.R.A.M |
Synchronous Graphics Random Access Memory |
| S.G.V |
Scalable Vector Graphics |
| S.H.A |
Secure Hash Algorithm |
| S.H.A.C |
Simple Hands-free Add-on Circuit |
| S.H.A.R.C |
Super Harvard Architecture Computer |
| S.H.F |
Super high frequency |
| S.H.F |
Super HyperFine (interaction) |
| S.H.G |
Second Harmonic Generation |
| S.I |
Semi-Insulating; Service Information |
| S.I.A |
Semiconductor Industry Association |
| S.I.C.A.T |
Siemens Concept Analog Telephone |
| S.I.C.O.F.I |
Signalling Codec Filter |
| S.I.D.P |
Sputter ion depth profiling |
| S.I.L |
Systems Integration Lab |
| S.I.M |
Subscriber Identity Module. |
| S.I.M.O |
Single Input Multiple Output. |
| S.I.M.O.X |
Separation by implantation of oxygen |
| S.I.M.S |
Secondary Ion Mass Spectroscopy |
| S.I.O |
Serial Input Output |
| S.I.O.A |
Surface Induced Optical Anisotropy |
| S.I.P |
Silicon Intellectual Property. |
| S.I.P |
Single in-line package |
| S.I.P |
Session Initiation Protocol |
| S.I.P |
Single in-line package |
| S.I.P.O |
Serial In Parallel output |
| S.I.R |
Surface Insulation Resistance |
| S.I.R.I.J |
Semiconductor Industry Research Institute of Japan |
| S.I.S.F.E.T |
Semiconductor-Insulator-Semiconductor FET |
| S.I.S.O |
Serial in serial out |
| S.I.S.O |
Single Input Single Output. |
| S.I.T |
Static Induction Transistor, System Interface Test |
| S.I.V |
Sensors in vacuum |
| S.L |
Specification limit; Super lattice |
| S.L.A.C |
Subscriber Line Audio processing interface |
| S.L.A.M |
Scanning laser acoustic microscopy |
| S.L.C |
Surface Laminar Circuit; Single Layer Cap |
| S.L.E.E.D |
Spin-Polarized Low Energy Electron Diffraction |
| S.L.I.C |
Standard-function Linear Integrated Circuit; Subscriber Line Interface
Circuit |
| S.L.I.C.O.F.I |
Subscriber Line Interface Circuit and Signaling Codec Filter |
| S.L.M |
Spatial Light Modulator |
| S.L.O.C |
Source lines of code |
| S.L.P.S.S |
Semiconductor Laser Pumped Solid State |
| S.L.S.I |
Super large scale integration |
| S.L.V |
Satellite Launch Vehicle. |
| S.M |
Stress migration; Surface mount |
| S.M.A |
Shape Memory Alloy; Surface Mount Assembly; Sub-Miniature type A |
| S.M.B |
Single-mask bumping |
| S.M.C |
Surface-mounted components |
| S.M.D |
Surface Mount Devices |
| S.M.E |
Subject matter expert; Software maintenance engineer |
| S.M.E.M.A |
Surface Mount Equipment Manufacturers Association |
| S.M.G |
Screen management guide |
| S.M.I.D |
Single Instruction Multiple Data |
| S.M.I.F |
Standard mechanical interface |
| S.M.I.L |
Synchronized Multi-media Integration Language |
